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Reflectance
measurements are always performed spectrally, as a function of
wavelength.
A small integrating sphere, a spectrometer and certified
reflectance standards are used to perform the reflectance
measurements.
The energy reflected through the sample is fully integrated
before reaching a baffled detector assembly. The reflectance is
weighted and integrated by the CIE Standard Photometric Observer
Function.
The spectrometer offers a measurement range covering the visible
region of the spectrum from 380 to 780 nanometer.
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